Inertial navigation conditions accompanied by measurement and control system
Category: Simulation System
Model: XPCK001
The inertial navigation condition accompanying measurement and control system is a device for testing inertial navigation chips. The system has excellent adaptability and can be flexibly adjusted according to different turntable configurations. It supports single batch testing of hundreds to several dry inertial navigation chips, achieving efficient batch testing. Relying on advanced algorithms to achieve fully automated data analysis, completely eliminating manual intervention, improving testing efficiency by a hundred times, and achieving an accuracy rate of over 99.9%.